Peer Reviewed Journals

• Journals

1. Pal, Hridibrata, Singh, et al. “Lateral P–N Junction Photodiodes Using Lateral Polarity Structure GaN Films: A Theoretical Perspective.” Journal of Electronic Materials(2023): 1-10. DOI: 10.1007/s11664-022-10166-z.

• Conferences

1. Yusuf, S. Singh, B. Sarkar, A. Dasgupta, and S. Roy “A Deep Learning Space Mapping based Enhancement of Compact Models for Accurate Prediction of Trapping in GaN HEMTs from DC to mm-Wave Frequency” has been accepted for oral presentation in International Microwave Symposium (IMS) 2023 to be held at San Diego.
2. S. Singh, and B. Sarkar “High-Performance UV Photodiodes using Lateral Polarity Structure GaN Films” in International Workshop on Nitride Semiconductors, October 2022. (Invited for poster presentation)
3. S. Singh, et.al “An Interpretable Symbolic Regression Model for Prediction of GaN Vertical Power MOSFET Failsafe Boundaries” has been accepted for poster presentation in IEEE Electron Devices Technology and Manufacturing Conference (IEEE EDTM) 2024 to be held in Bangalore. Also, it is eligible for inclusion in the conference proceedings which will be archived on IEEE Xplore.